Accelerated life test(ALT) is currently the main method of assessing product reliability rapidly, and the design of efficient test plans is a critical step to ensure that ALTs can assess the product reliability accurately, quickly, and economically. With the promotion of the national strategy of civil-military integration, ALT will be widely used in the research and development(R&D) of various types of products, and the ALT plan design theory will face further challenges. To aid engineers in selecting appropriate theories and to stimulate researchers to develop the theories required in engineering, with focus on the demands for theory research that arise from the implementation of ALT, this paper reviews and summarizes the development of ALT plan design theory. The development of the theory and method for planning optimal ALT for location-scale distribution, which is the most applied and mature theory of designing the optimal ALT plan, are described in detail. Taking this as the center of radiation, some problems that ALT now faces, such as the verification of the statistical model, limitation of sample size, solutions of resource limits, optimization of the test arrangement, and management of product complexity, are discussed, and the general ideas and methods of solving these problems are analyzed. Suggestions for selecting appropriate ALT plan design theories are proposed, and the urgent solved theory problems and opinions of their solutions are proposed. Based on the principle of convenience for engineers to select appropriate methods according to the problems found in practice, this paper reviews the development of optimal ALT plan design theory by taking the engineering problems arising from the ALT implementation as the main thread, provides guidelines on selecting appropriate theories for engineers, and proposes opinions about the urgent solved theory problems for researchers.
Wen-Hua ChenLiang GaoJun PanPing QianQing-Chuan He
For planning optimum multiple stresses accelerated life test plans, a commonly followed guiding principle is that all parameters of the life-stress relationship should be estimated, and the number of the stress level combinations must be no less than the number of parameters of the life-stress relationship. However, the general objective of an accelerated life test(ALT) is to assess the p-th quantile of the product life distribution under normal stress. For this objective, estimating all model parameters is not necessary, and this will increase the cost of test. Based on the theoretical conclusion that the stress level combinations of the optimum multiple stresses ALT plan locate on a straight line through the origin of coordinate, it is proposed that a design idea of planning the optimum multiple stresses ALT plan through transforming the problem of designing an optimum multiple stresses ALT plan to designing an optimum single stress ALT plan. Moreover, a method of planning the optimum multiple stresses ALT plan which can avoid estimating all model parameters is established. An example shows that, the proposed plan which only has two stress level combinations could achieve an accuracy no less than the traditional plan, and save the test time and cost on one stress level combination at least; when the actual product life is less than the design value, even the deviation of the model initial parameters value is up to 20%, the variance of the estimation of the p-th quantile of the proposed plan is still smaller than the traditional plans approximately 25%. A design method is provided for planning the optimum multiple stresses ALT which uses the statistical optimum degenerate test plan as the optimum multiple stresses accelerated life test plan.
In order to get a rapid assessment on the storage reliability of high-reliable and long-life products within the storage period,accelerated degradation test data with a large amount of reliability information of product is adopted.Conducting a constant-stress accelerated degradation test(CSADT)is generally very costly as it requires a large sample size and long time for test.To overcome this problem,it is necessary to carry out research on modeling and statistical analysis methods of step-stress accelerated degradation test(SSADT).Taking electrical connectors as the object,a research is conducted on statistical model and assessment method for SSADT.On the basis of mixed-effect degradation path model,the statistical model of SSADT for electrical connectors is presented,the maximum likelihood method for SSADT data based on mixed-effect degradation model is proposed.SSADT accelerated by temperature stress is conducted to Y11X-1419 type of electrical connectors,and the storage reliability is assessed with the SSADT data.Compared with the result obtained from accelerated life test,the reliability estimation of 32-year storage period for electrical connectors obtained from SSADT data only have a difference of 0.869%,which validates the accuracy of the degradation model and the feasibility of the test data statistic analysis method put forward.
