Variation of substrate background doping will affect the charge collection of active and passive MOSFETs in complementary metal-oxide semiconductor (CMOS) technologies,which are significant for charge sharing,thus affecting the propagated single event transient pulsewidths in circuits.The trends of charge collected by the drain of a positive channel metal-oxide semiconductor (PMOS) and an N metal-oxide semiconductor (NMOS) are opposite as the substrate doping increases.The PMOS source will inject carriers after strike and the amount of charge injected will increase as the substrate doping increases,whereas the source of the NMOS will mainly collect carriers and the source of the NMOS can also inject electrons when the substrate doping is light enough.Additionally,it indicates that substrate doping mainly affects the bipolar amplification component of a single-event transient current,and has little effect on the drift and diffusion.The change in substrate doping has a much greater effect on PMOS than on NMOS.
In this paper,we investigate the temperature and drain bias dependency of single event transient(SET) in 25-nm fin field-effect-transistor(FinFET) technology in a temperature range of 0-135°C and supply voltage range of 0.4 V-1.6 V.Technology computer-aided design(TCAD) three-dimensional simulation results show that the drain current pulse duration increases from 0.6 ns to 3.4 ns when the temperature increases from 0 to 135°C.The charge collected increases from 45.5 fC to 436.9 fC and the voltage pulse width decreases from 0.54 ns to 0.18 ns when supply voltage increases from 0.4 V to 1.6 V.Furthermore,simulation results and the mechanism of temperature and bias dependency are discussed.
Using computer-aided design three-dimensional (3D) simulation technology,the recovery mechanism of single event upset and the effects of spacing and hit angle on the recovery are studied.It is found that the multi-node charge collection plays a key role in recovery and shielding the charge sharing by adding guard rings.It cannot exhibit the recovery effect.It is also indicated that the upset linear energy transfer (LET) threshold is kept constant while the recovery LET threshold increases as the spacing increases.Additionally,the effect of incident angle on recovery is analysed and it is shown that a larger angle can bring about a stronger charge sharing effect,thus strengthening the recovery ability.
Using Geant4 Monte Carlo code and Technology Computer-Aided Design(TCAD) simulation,energy deposition and charge collection of single event effects(SEE) are studied,which are induced by low-energy protons and α particles in small feature size devices.We analyzed charge collection of SEE especially at Bragg's peak and obtained two types of deposited energy distributions of protons and α particles at different incident energies.The two components of the total charge collected are quantified,which are due to drift current of the space charge region and current in the funnel region separately.Results explain the high soft error rate in experiments of low energy proton.
LIU Zheng CHEN ShuMing LIANG Bin LIU BiWei ZHAO ZhenYu
