The impact of the variations of threshold voltage(V_(th))and hold voltage(V_(hold))of threshold switching(TS)selector in1 S1 R crossbar array is investigated.Based on ON/OFF state I–V curves measurements from a large number of Ag-filament TS selectors,V_(th)and V_(hold)are extracted and their variations distribution expressions are obtained,which are then employed to evaluate the impact on read process and write process in 32×321 S1 R crossbar array under different bias schemes.The results indicate that V_(th)and V_(hold)variations of TS selector can lead to degradation of 1 S1 R array performance parameters,such as minimum read/write voltage,bit error rate(BER),and power consumption.For the read process,a small V_(hold)variation not only results in the minimum read voltage increasing but it also leads to serious degradation of BER.As the standard deviation of V_(hold)and V_(th)increases,the BER and the power consumption of 1 S1 R crossbar array under 1/2 bias,1/3 bias,and floating scheme degrade,and the case under 1/2 bias tends to be more serious compared with other two schemes.For the write process,the minimum write voltage also increases with the variation of V_(hold)from small to large value.A slight increase of V_(th)standard deviation not only decreases write power efficiency markedly but also increases write power consumption.These results have reference significance to understand the voltage variation impacts and design of selector properly.
