As few or no failures occur during accelerated life test,it is difficult to assess reliability for long-life products with traditional life tests.Reliability assessment using degradation data of product performance over time becomes a significant approach.Aerospace electrical connector is researched in this paper.Through the analysis of failure mechanism,the performance degradation law is obtained and the statistical model for degradation failure is set up;according to the research on statistical analysis methods for degradation data,accelerated life test theory and method for aerospace electrical connector based on performance degradation is proposed by improving time series analysis method,and the storage reliability is assessed for Y11X series of aerospace electrical connector with degradation data from accelerated degradation test.The result obtained is basically consistent with that obtained from accelerated life test based on failure data,and the two estimates of product's characteristic life only have a difference of 8.7%,but the test time shortens about a half.As a result,a systemic approach is proposed for reliability assessment of highly reliable and long-life aerospace product.
For optimal design of constant stress accelerated life test(CSALT) with two-stress, if the stresses could not reach the highest levels simultaneously, the test region becomes non-rectangular. For optimal CSALT design on non-rectangle test region, the present method is only focused on non-rectangle test region with simple boundary, and the optimization algorithm is based on experience which can not ensure to obtain the optimal plan. In this paper, considering the linear-extreme value model and the optimization goal to minimize the variance of lifetime estimate under normal stress, the optimal design method of two-stress type-Ⅰ censored CSALT plan on general non-rectangular test region is proposed. First, two properties of optimal test plans are proved and the relationship of all the optimal test plans is determined analytically. Then, on the basis of the two properties, the optimal problem is simplified and the optimal design method of two-stress CSALT plan on general non-rectangular test region is proposed. Finally, a numerical example is used to illustrate the feasibility and effectiveness of the method. The result shows that the proposed method could obtain the optimal test plan on non-rectangular test regions with arbitrary boundaries. This research provides the theory and method for two-stress optimal CSALT planning on non-rectangular test regions.
For planning optimum multiple stresses accelerated life test plans, a commonly followed guiding principle is that all parameters of the life-stress relationship should be estimated, and the number of the stress level combinations must be no less than the number of parameters of the life-stress relationship. However, the general objective of an accelerated life test(ALT) is to assess the p-th quantile of the product life distribution under normal stress. For this objective, estimating all model parameters is not necessary, and this will increase the cost of test. Based on the theoretical conclusion that the stress level combinations of the optimum multiple stresses ALT plan locate on a straight line through the origin of coordinate, it is proposed that a design idea of planning the optimum multiple stresses ALT plan through transforming the problem of designing an optimum multiple stresses ALT plan to designing an optimum single stress ALT plan. Moreover, a method of planning the optimum multiple stresses ALT plan which can avoid estimating all model parameters is established. An example shows that, the proposed plan which only has two stress level combinations could achieve an accuracy no less than the traditional plan, and save the test time and cost on one stress level combination at least; when the actual product life is less than the design value, even the deviation of the model initial parameters value is up to 20%, the variance of the estimation of the p-th quantile of the proposed plan is still smaller than the traditional plans approximately 25%. A design method is provided for planning the optimum multiple stresses ALT which uses the statistical optimum degenerate test plan as the optimum multiple stresses accelerated life test plan.
In order to get a rapid assessment on the storage reliability of high-reliable and long-life products within the storage period,accelerated degradation test data with a large amount of reliability information of product is adopted.Conducting a constant-stress accelerated degradation test(CSADT)is generally very costly as it requires a large sample size and long time for test.To overcome this problem,it is necessary to carry out research on modeling and statistical analysis methods of step-stress accelerated degradation test(SSADT).Taking electrical connectors as the object,a research is conducted on statistical model and assessment method for SSADT.On the basis of mixed-effect degradation path model,the statistical model of SSADT for electrical connectors is presented,the maximum likelihood method for SSADT data based on mixed-effect degradation model is proposed.SSADT accelerated by temperature stress is conducted to Y11X-1419 type of electrical connectors,and the storage reliability is assessed with the SSADT data.Compared with the result obtained from accelerated life test,the reliability estimation of 32-year storage period for electrical connectors obtained from SSADT data only have a difference of 0.869%,which validates the accuracy of the degradation model and the feasibility of the test data statistic analysis method put forward.
